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1 Ergebnisse
1
Heavy Ion and Proton Induced Single Event Effects on Microc..:
, In:
2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
,
Rezzak, N.
;
Wang, J.J.
;
Chipana, R.
... - p. 1-4 , 2020
Link:
https://doi.org/10.1109/RADECS50773.2020.9857704
RT T1
2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
: T1
Heavy Ion and Proton Induced Single Event Effects on Microchip RT PolarFire FPGA
UL https://suche.suub.uni-bremen.de/peid=ieee-9857704&Exemplar=1&LAN=DE A1 Rezzak, N. A1 Wang, J.J. A1 Chipana, R. A1 Lao, C. A1 Bakker, G. A1 Hawley, F. A1 Hamdy, E. YR 2020 SN 1609-0438 K1 Protons K1 SONOS devices K1 Particle beams K1 Error analysis K1 Single event upsets K1 Europe K1 Ions K1 Single-Event Effects K1 FPGA K1 SONOS SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/RADECS50773.2020.9857704 DO https://doi.org/10.1109/RADECS50773.2020.9857704 SF ELIB - SuUB Bremen
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