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1 Ergebnisse
1
Impact of Gamma irradiation on advanced Si/SiGe:C BiCMOS te..:
, In:
2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
,
El Beyrouthy, J.
;
Sagnes, B.
;
Pascal, F.
... - p. 1-4 , 2020
Link:
https://doi.org/10.1109/RADECS50773.2020.9857722
RT T1 <cTitle>2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS)</cTitle>: T1 <Title>Impact of Gamma irradiation on advanced Si/SiGe:C BiCMOS technology: comparison versus X-ray</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9857722&Exemplar=1&LAN=DE A1 El Beyrouthy, J. A1 Sagnes, B. A1 Pascal, F. A1 Elsherif, M. A1 Boch, J. A1 Maraine, T. A1 Haendler, S. A1 Chevalier, P. A1 Gloria, D. YR 2020 SN 1609-0438 K1 Degradation K1 Radiation effects K1 Density measurement K1 Current measurement K1 Europe K1 BiCMOS integrated circuits K1 Frequency measurement K1 HBTs K1 Si/SiGe K1 Gamma irradiation K1 X-ray irradiation K1 Total Ionizing Dose (TID) K1 Gummel-plot K1 Low Frequency Noise K1 1/f Noise SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/RADECS50773.2020.9857722 DO https://doi.org/10.1109/RADECS50773.2020.9857722 SF ELIB - SuUB Bremen
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