I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Heavy Ion Irradiation Hardening Study on 4kb arrays HfO2-ba..:
, In:
2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
,
Guillaume, N.
;
Lefevre, G.
;
Charpin-Nicolle, C.
... - p. 1-6 , 2020
Link:
https://doi.org/10.1109/RADECS50773.2020.9857730
RT T1 <cTitle>2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS)</cTitle>: T1 <Title>Heavy Ion Irradiation Hardening Study on 4kb arrays HfO2-based OxRAM</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9857730&Exemplar=1&LAN=DE A1 Guillaume, N. A1 Lefevre, G. A1 Charpin-Nicolle, C. A1 Grenouillet, L. A1 Vogel, T. A1 Kaiser, N. A1 Piros, E. A1 Petzold, S. A1 Trautmann, C. A1 Sylvain, D. A1 Vallee, C. A1 Alff, L. A1 Nowak, E. YR 2020 SN 1609-0438 K1 Degradation K1 Performance evaluation K1 Radiation effects K1 Quantum mechanics K1 Voltage K1 Programming K1 Ions K1 Heavy ion irradiation K1 ReRAM K1 OxRAM K1 1T1R K1 4kbits arrays K1 Electrical characterization K1 TEM K1 nano-diffraction K1 EDX SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/RADECS50773.2020.9857730 DO https://doi.org/10.1109/RADECS50773.2020.9857730 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
