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1 Ergebnisse
1
Fabric Defect Detection VIA Unsupervised Neural Networks:
, In:
2022 IEEE International Conference on Multimedia and Expo Workshops (ICMEW)
,
Liu, Kuan-Hsien
;
Chen, Song-Jie
;
Chiu, Ching-Hsiang
. - p. 1-6 , 2022
Link:
https://doi.org/10.1109/ICMEW56448.2022.9859266
RT T1
2022 IEEE International Conference on Multimedia and Expo Workshops (ICMEW)
: T1
Fabric Defect Detection VIA Unsupervised Neural Networks
UL https://suche.suub.uni-bremen.de/peid=ieee-9859266&Exemplar=1&LAN=DE A1 Liu, Kuan-Hsien A1 Chen, Song-Jie A1 Chiu, Ching-Hsiang A1 Liu, Tsung-Jung YR 2022 K1 Training K1 Surface cleaning K1 Industries K1 Neural networks K1 Process control K1 Quality control K1 Production K1 Autoencoder K1 defect detection K1 image reconstruction K1 image synthesis K1 unsupervised learning SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/ICMEW56448.2022.9859266 DO https://doi.org/10.1109/ICMEW56448.2022.9859266 SF ELIB - SuUB Bremen
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