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Fabric Defect Detection VIA Unsupervised Neural Networks:

, In: 2022 IEEE International Conference on Multimedia and Expo Workshops (ICMEW),
Liu, Kuan-Hsien ; Chen, Song-Jie ; Chiu, Ching-Hsiang. - p. 1-6 , 2022
Link: https://doi.org/10.1109/ICMEW56448.2022.9859266