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Die-Level Defects Classification using Region-based Convolu..:

, In: 2022 IEEE International Conference on Semiconductor Electronics (ICSE),
You, Kwong Ming ; Sheikh, Usman Ullah ; binti Alias, Nurul Ezaila - p. 144-147 , 2022
Link: https://doi.org/10.1109/ICSE56004.2022.9863135