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Superior Reliability and Low Self-Heating of a 45nm CMOS 39..:

, In: 2022 IEEE Radio Frequency Integrated Circuits Symposium (RFIC),
Srinivasan, P. ; Syed, S. ; Sundaram, J. A.... - p. 195-198 , 2022
Link: https://doi.org/10.1109/RFIC54546.2022.9863154