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1 Ergebnisse
1
A March 5n FSM-Based Memory Built-In Self-Test (MBIST) Arch..:
, In:
2022 IEEE International Conference on Semiconductor Electronics (ICSE)
,
Ng, Kok Heng
;
Alias, Nurul Ezaila
;
Hamzah, Afiq
... - p. 69-72 , 2022
Link:
https://doi.org/10.1109/ICSE56004.2022.9863160
RT T1 <cTitle>2022 IEEE International Conference on Semiconductor Electronics (ICSE)</cTitle>: T1 <Title>A March 5n FSM-Based Memory Built-In Self-Test (MBIST) Architecture with Diagnosis Capabilities</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9863160&Exemplar=1&LAN=DE A1 Ng, Kok Heng A1 Alias, Nurul Ezaila A1 Hamzah, Afiq A1 Tan, Michael Loong Peng A1 Sheikh, Usman Ullah A1 Wahab, Yasmin Abdul YR 2022 K1 Couplings K1 Wiring K1 Power demand K1 Design methodology K1 Computer architecture K1 Maintenance engineering K1 Built-in self-test K1 MBIST K1 improved March 5n K1 fault coverage SP 69 OP 72 LK http://dx.doi.org/https://doi.org/10.1109/ICSE56004.2022.9863160 DO https://doi.org/10.1109/ICSE56004.2022.9863160 SF ELIB - SuUB Bremen
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