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Defects caused by degradation – A stumbling block for nanoc..:

, In: 2022 IEEE 4th International Conference on Dielectrics (ICD),
Werner, S. ; Kaschta, J. ; Schubert, D.W. - p. 265-268 , 2022
Link: https://doi.org/10.1109/ICD53806.2022.9863232