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1 Ergebnisse
1
Analysis of Small Reactance overload Faults in a 750kV Stro..:
, In:
2022 IEEE 4th International Conference on Dielectrics (ICD)
,
Shan, Li
;
Yadi, Xie
;
Rui, Dang
.. - p. 175-180 , 2022
Link:
https://doi.org/10.1109/ICD53806.2022.9863456
RT T1 <cTitle>2022 IEEE 4th International Conference on Dielectrics (ICD)</cTitle>: T1 <Title>Analysis of Small Reactance overload Faults in a 750kV Strongly Coupled Parallel Single Circuit Erection Line</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9863456&Exemplar=1&LAN=DE A1 Shan, Li A1 Yadi, Xie A1 Rui, Dang A1 Fenglei, Mu A1 Xiunan, Chu YR 2022 K1 Shunts (electrical) K1 Construction K1 Power transmission lines K1 Power transmission K1 Voltage K1 High-voltage techniques K1 Power grids K1 EHV K1 Parallel line erection K1 Electrical coupling K1 Induced voltage K1 Induced current SP 175 OP 180 LK http://dx.doi.org/https://doi.org/10.1109/ICD53806.2022.9863456 DO https://doi.org/10.1109/ICD53806.2022.9863456 SF ELIB - SuUB Bremen
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