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1 Ergebnisse
1
Device Reliability Affecting Coding Schemes in Neuromorphic..:
, In:
2022 IEEE Region 10 Symposium (TENSYMP)
,
Picardo, Siona Menezes
;
Shaik, Jani Babu
;
Singhal, Sonal
. - p. 1-6 , 2022
Link:
https://doi.org/10.1109/TENSYMP54529.2022.9864392
RT T1
2022 IEEE Region 10 Symposium (TENSYMP)
: T1
Device Reliability Affecting Coding Schemes in Neuromorphic Circuits
UL https://suche.suub.uni-bremen.de/peid=ieee-9864392&Exemplar=1&LAN=DE A1 Picardo, Siona Menezes A1 Shaik, Jani Babu A1 Singhal, Sonal A1 Goel, Nilesh YR 2022 SN 2642-6102 K1 Degradation K1 Silicon compounds K1 Human computer interaction K1 Neuromorphics K1 Neurons K1 Encoding K1 Reliability K1 reliability issues K1 BTI & HCI K1 neuromorphic circuits K1 adaptation exponential integrate & fire (I&F) circuits SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/TENSYMP54529.2022.9864392 DO https://doi.org/10.1109/TENSYMP54529.2022.9864392 SF ELIB - SuUB Bremen
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