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1 Ergebnisse
1
A Cryogenic On-Chip Noise Measurement Procedure With ±1.4-K..:
, In:
2022 IEEE/MTT-S International Microwave Symposium - IMS 2022
,
Heinz, Felix
;
Thome, Fabian
;
Leuther, Arnulf
. - p. 233-236 , 2022
Link:
https://doi.org/10.1109/IMS37962.2022.9865294
RT T1 <cTitle>2022 IEEE/MTT-S International Microwave Symposium - IMS 2022</cTitle>: T1 <Title>A Cryogenic On-Chip Noise Measurement Procedure With ±1.4-K Measurement Uncertainty</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9865294&Exemplar=1&LAN=DE A1 Heinz, Felix A1 Thome, Fabian A1 Leuther, Arnulf A1 Ambacher, Oliver YR 2022 SN 2576-7216 K1 Microwave measurement K1 Semiconductor device measurement K1 Attenuators K1 Uncertainty K1 Measurement uncertainty K1 Cryogenics K1 System-on-chip K1 high-electron-mobility transistors (HEMTs) K1 low-noise amplifiers (LNAs) K1 metamorphic HEMTs (mHEMTs) K1 monolithic microwave integrated circuits (MMICs) K1 noise K1 noise measurement K1 noise modeling SP 233 OP 236 LK http://dx.doi.org/https://doi.org/10.1109/IMS37962.2022.9865294 DO https://doi.org/10.1109/IMS37962.2022.9865294 SF ELIB - SuUB Bremen
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