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1 Ergebnisse
1
Rydberg Atomic Electrometry: A Near-Field Technology for Co..:
, In:
2022 IEEE/MTT-S International Microwave Symposium - IMS 2022
,
Booth, D.
;
Nickerson, K.
;
Bohaichuk, S.
.. - p. 853-855 , 2022
Link:
https://doi.org/10.1109/IMS37962.2022.9865387
RT T1 <cTitle>2022 IEEE/MTT-S International Microwave Symposium - IMS 2022</cTitle>: T1 <Title>Rydberg Atomic Electrometry: A Near-Field Technology for Complete Far-Field Imaging in Seconds?</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9865387&Exemplar=1&LAN=DE A1 Booth, D. A1 Nickerson, K. A1 Bohaichuk, S. A1 Erskine, J. A1 Shaffer, J.P. YR 2022 SN 2576-7216 K1 Atomic measurements K1 Radio frequency K1 Rydberg atoms K1 Prototypes K1 Bandwidth K1 Optics K1 Microwave theory and techniques K1 quantum sensing K1 electrometry K1 over the air testing K1 electromagnetically induced transparency K1 quantum optics SP 853 OP 855 LK http://dx.doi.org/https://doi.org/10.1109/IMS37962.2022.9865387 DO https://doi.org/10.1109/IMS37962.2022.9865387 SF ELIB - SuUB Bremen
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