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1 Ergebnisse
1
Image Confusion Applied to Industrial Defect Detection Syst..:
, In:
2022 IEEE International Conference on Consumer Electronics - Taiwan
,
Chen, Hao-Yuan
;
Yeh, Yu-Chen
;
Lu, Makena
. - p. 463-464 , 2022
Link:
https://doi.org/10.1109/ICCE-Taiwan55306.2022.9869058
RT T1 <cTitle>2022 IEEE International Conference on Consumer Electronics - Taiwan</cTitle>: T1 <Title>Image Confusion Applied to Industrial Defect Detection System</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9869058&Exemplar=1&LAN=DE A1 Chen, Hao-Yuan A1 Yeh, Yu-Chen A1 Lu, Makena A1 Lin, Chia-Yu YR 2022 SN 2575-8284 K1 Data privacy K1 Manufacturing processes K1 Prediction algorithms K1 Data models K1 Image restoration K1 Security K1 Artificial intelligence SP 463 OP 464 LK http://dx.doi.org/https://doi.org/10.1109/ICCE-Taiwan55306.2022.9869058 DO https://doi.org/10.1109/ICCE-Taiwan55306.2022.9869058 SF ELIB - SuUB Bremen
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