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1 Ergebnisse
1
An Investigation of ESD-Enhancement by the Drain-side Embed..:
, In:
2022 IEEE International Conference on Consumer Electronics - Taiwan
,
Liu, Zhi-Wei
;
Chen, Shen-Li
;
Lai, Jhong-Yi
.. - p. 73-74 , 2022
Link:
https://doi.org/10.1109/ICCE-Taiwan55306.2022.9869111
RT T1 <cTitle>2022 IEEE International Conference on Consumer Electronics - Taiwan</cTitle>: T1 <Title>An Investigation of ESD-Enhancement by the Drain-side Embedded SCR Area Modulation for HV pLDMOSs</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9869111&Exemplar=1&LAN=DE A1 Liu, Zhi-Wei A1 Chen, Shen-Li A1 Lai, Jhong-Yi A1 Mai, Xing-Chen A1 Chung, Yu-Jie YR 2022 SN 2575-8284 K1 Thyristors K1 MOSFET K1 Transmission lines K1 Electric breakdown K1 Layout K1 Modulation K1 Doping SP 73 OP 74 LK http://dx.doi.org/https://doi.org/10.1109/ICCE-Taiwan55306.2022.9869111 DO https://doi.org/10.1109/ICCE-Taiwan55306.2022.9869111 SF ELIB - SuUB Bremen
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