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ESD Capability Analysis of High-voltage nLDMOSs by the Bulk..:

, In: 2022 IEEE International Conference on Consumer Electronics - Taiwan,
Lai, Jhong-Yi ; Chen, Shen-Li ; Liu, Zhi-Wei.. - p. 71-72 , 2022
Link: https://doi.org/10.1109/ICCE-Taiwan55306.2022.9869178