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Dependence of SiO2 Gate Leakage Current on Annealing Temper..:

, In: 2022 IEEE International Conference on Consumer Electronics - Taiwan,
Jhang, Wun-Ciang ; Chen, Pin-Han ; Hsu, Chih-Chieh - p. 569-570 , 2022
Link: https://doi.org/10.1109/ICCE-Taiwan55306.2022.9869260