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1 Ergebnisse
1
Gate Voltages Impacting on Latch-up Measurements:
, In:
2022 IEEE International Conference on Consumer Electronics - Taiwan
,
Huang, Shao-Chang
;
Lee, Jian-Hsing
;
Chen, Chun-Chih
... - p. 75-76 , 2022
Link:
https://doi.org/10.1109/ICCE-Taiwan55306.2022.9869282
RT T1 <cTitle>2022 IEEE International Conference on Consumer Electronics - Taiwan</cTitle>: T1 <Title>Gate Voltages Impacting on Latch-up Measurements</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9869282&Exemplar=1&LAN=DE A1 Huang, Shao-Chang A1 Lee, Jian-Hsing A1 Chen, Chun-Chih A1 Li, Ching-Ho A1 Liao, Chih-Cherng A1 Hsu, Kai-Chieh A1 Lin, Gong-Kai A1 Chen, Li-Fan A1 Wang, Chien-Wei A1 Lin, Chih-Hsuan A1 Jou, Yeh-Ning A1 Chen, Ke-Horng YR 2022 SN 2575-8284 K1 Integrated circuits K1 MOSFET K1 Voltage measurement K1 Data analysis K1 Current measurement K1 Logic gates K1 Size measurement SP 75 OP 76 LK http://dx.doi.org/https://doi.org/10.1109/ICCE-Taiwan55306.2022.9869282 DO https://doi.org/10.1109/ICCE-Taiwan55306.2022.9869282 SF ELIB - SuUB Bremen
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