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1 Ergebnisse
1
Eddy Current Sensor as In-situ Assessment and Characterizat..:
, In:
2022 IEEE IAS Global Conference on Emerging Technologies (GlobConET)
,
Dutta, Chandan
;
Sagar, S. Palit
;
Kumar, Alok
... - p. 429-434 , 2022
Link:
https://doi.org/10.1109/GlobConET53749.2022.9872422
RT T1 <cTitle>2022 IEEE IAS Global Conference on Emerging Technologies (GlobConET)</cTitle>: T1 <Title>Eddy Current Sensor as In-situ Assessment and Characterization of In-process Surface Defects in Wires/Rods Using Machine Learning Algorithms</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9872422&Exemplar=1&LAN=DE A1 Dutta, Chandan A1 Sagar, S. Palit A1 Kumar, Alok A1 Bhushan, Ravi A1 Kadu, Satish A1 Das, Tarun K. YR 2022 K1 Support vector machines K1 Machine learning algorithms K1 Signal processing algorithms K1 Quality control K1 Inspection K1 Noise measurement K1 Kernel K1 Machine learning K1 Single tones ECT K1 Artificial Neural Network K1 Support Vector Machine K1 And Gaussian Kernel functions SP 429 OP 434 LK http://dx.doi.org/https://doi.org/10.1109/GlobConET53749.2022.9872422 DO https://doi.org/10.1109/GlobConET53749.2022.9872422 SF ELIB - SuUB Bremen
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