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A Reliability Assessment Approach for GaN-Based Power Suppl:

, In: 2022 23rd International Conference on Electronic Packaging Technology (ICEPT),
Jinghao, Liang ; Bo, Sun ; Chunbing, Guo. - p. 1-5 , 2022
Link: https://doi.org/10.1109/ICEPT56209.2022.9872649