I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

Study on Single-Event Gate Rapture of Si VDMOSFET: failure ..:

, In: 2022 23rd International Conference on Electronic Packaging Technology (ICEPT),
Lang, Lei ; Luo, Houcai ; Chen, Xianping.. - p. 1-4 , 2022
Link: https://doi.org/10.1109/ICEPT56209.2022.9873265