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1 Ergebnisse
1
Thermal-mechanical Reliability of Sintered Nano-Ag Bond Pad..:
, In:
2022 23rd International Conference on Electronic Packaging Technology (ICEPT)
,
Lo, Jeffery C. C.
;
Jiang, Qian
;
Qiu, Xing
.. - p. 1-4 , 2022
Link:
https://doi.org/10.1109/ICEPT56209.2022.9873290
RT T1
2022 23rd International Conference on Electronic Packaging Technology (ICEPT)
: T1
Thermal-mechanical Reliability of Sintered Nano-Ag Bond Pads Printed by Aerosol Jet
UL https://suche.suub.uni-bremen.de/peid=ieee-9873290&Exemplar=1&LAN=DE A1 Lo, Jeffery C. C. A1 Jiang, Qian A1 Qiu, Xing A1 Tu, Ning A1 Lee, S. W. Ricky YR 2022 K1 Adhesives K1 Semiconductor device reliability K1 Lithography K1 Thermomechanical processes K1 Thermal shock K1 Failure analysis K1 Ink K1 additive manufacturing K1 aerosol jet printing K1 nano particle Ag ink K1 redistribution layer SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ICEPT56209.2022.9873290 DO https://doi.org/10.1109/ICEPT56209.2022.9873290 SF ELIB - SuUB Bremen
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