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Investigation of bias stress degradation of Depletion-Mode ..:

, In: 2022 23rd International Conference on Electronic Packaging Technology (ICEPT),
Guo, Chenrun ; Zhou, Bin ; Lai, Canxiong... - p. 1-5 , 2022
Link: https://doi.org/10.1109/ICEPT56209.2022.9873497