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1 Ergebnisse
1
Low Resistivity Tungsten and Ruthenium through Textural Con..:
, In:
2022 IEEE International Interconnect Technology Conference (IITC)
,
Mehta, Rutvik J.
;
Cerio, Frank
;
Wang, Yuejing Crystal
... - p. 148-150 , 2022
Link:
https://doi.org/10.1109/IITC52079.2022.9881301
RT T1
2022 IEEE International Interconnect Technology Conference (IITC)
: T1
Low Resistivity Tungsten and Ruthenium through Textural Control Using Ion Beam Deposition
UL https://suche.suub.uni-bremen.de/peid=ieee-9881301&Exemplar=1&LAN=DE A1 Mehta, Rutvik J. A1 Cerio, Frank A1 Wang, Yuejing Crystal A1 Turner, Paul A1 Kim, Jinho A1 Kulkarni, Ashish A1 Saghayezhian, Mohammad A1 Caldwell, Robert YR 2022 SN 2380-6338 K1 Wiring K1 Ruthenium K1 Wires K1 Tungsten K1 Random access memory K1 Conductivity K1 Microstructure K1 ion beam deposition K1 sputtering K1 microstructure control K1 back end of the line K1 tungsten K1 ruthenium K1 metal wires K1 interconnects SP 148 OP 150 LK http://dx.doi.org/https://doi.org/10.1109/IITC52079.2022.9881301 DO https://doi.org/10.1109/IITC52079.2022.9881301 SF ELIB - SuUB Bremen
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