Merkliste 
 1 Ergebnisse 
 
1

P and L Band Reflectometry Modelling Based on Analytical Ki..:

, In: IGARSS 2022 - 2022 IEEE International Geoscience and Remote Sensing Symposium,
Xu, Haokui ; Tsang, Leung ; Jeong, Jongwoo... - p. 4688-4690 , 2022