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A 180o Phase Shift Biasing Technique for Realizing High PSR..:
, In:
2022 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems (VLSID)
,
Jain, Arpan
;
Pullela, Abhishek
;
Ali, Ashfakh
. - p. 33-38 , 2022
Link:
https://doi.org/10.1109/VLSID2022.2022.00019
RT T1 <cTitle>2022 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems (VLSID)</cTitle>: T1 <Title>A 180o Phase Shift Biasing Technique for Realizing High PSRR in Low Power Temperature Sensors</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9885830&Exemplar=1&LAN=DE A1 Jain, Arpan A1 Pullela, Abhishek A1 Ali, Ashfakh A1 Abbas, Zia YR 2022 SN 2380-6923 K1 Temperature sensors K1 Temperature distribution K1 MOSFET K1 Monte Carlo methods K1 Power supplies K1 Simulation K1 Very large scale integration K1 PSRR K1 Composite Pair K1 Temperature Sensor K1 Reference K1 Line regulation K1 Power Supply SP 33 OP 38 LK http://dx.doi.org/https://doi.org/10.1109/VLSID2022.2022.00019 DO https://doi.org/10.1109/VLSID2022.2022.00019 SF ELIB - SuUB Bremen
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