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1 Ergebnisse
1
Easily-Verifiable Design of Non-Scan Sequential Machines fo..:
, In:
2022 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems (VLSID)
,
Rahaman, Habibur
;
Chattopadhyay, Santanu
;
Sengupta, Indranil
.. - p. 246-251 , 2022
Link:
https://doi.org/10.1109/VLSID2022.2022.00055
RT T1 <cTitle>2022 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems (VLSID)</cTitle>: T1 <Title>Easily-Verifiable Design of Non-Scan Sequential Machines for Conformance Checking</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9885877&Exemplar=1&LAN=DE A1 Rahaman, Habibur A1 Chattopadhyay, Santanu A1 Sengupta, Indranil A1 Das, Debesh K. A1 Bhattacharya, Bhargab B. YR 2022 SN 2380-6923 K1 Training K1 Embedded systems K1 Neural networks K1 Metaheuristics K1 Benchmark testing K1 Very large scale integration K1 Hardware K1 Conformance checking K1 non-scan sequential circuits K1 design verification K1 deep neural network (DNN) SP 246 OP 251 LK http://dx.doi.org/https://doi.org/10.1109/VLSID2022.2022.00055 DO https://doi.org/10.1109/VLSID2022.2022.00055 SF ELIB - SuUB Bremen
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