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1 Ergebnisse
1
40nm Ultra-low Leakage SRAM with Embedded Sub-threshold Ana..:
, In:
2022 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems (VLSID)
,
Dhori, Kedar Janardan
;
Kumar, Promod
;
Lecocq, Christophe
... - p. 216-221 , 2022
Link:
https://doi.org/10.1109/VLSID2022.2022.00050
RT T1 <cTitle>2022 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems (VLSID)</cTitle>: T1 <Title>40nm Ultra-low Leakage SRAM with Embedded Sub-threshold Analog Closed Loop System for Efficient Source Biasing of the Memory Array in Retention Mode</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9885904&Exemplar=1&LAN=DE A1 Dhori, Kedar Janardan A1 Kumar, Promod A1 Lecocq, Christophe A1 Urard, Pascal A1 Callen, Olivier A1 Cacho, Florian A1 Parra, Maryline A1 Pandey, Prashant A1 Noblet, Daniel YR 2022 SN 2380-6923 K1 Temperature sensors K1 Temperature measurement K1 Random access memory K1 Very large scale integration K1 Silicon K1 Regulation K1 Temperature control K1 SRAM K1 Low Leakage K1 IoT K1 Low Vmin K1 source bias K1 RNM SP 216 OP 221 LK http://dx.doi.org/https://doi.org/10.1109/VLSID2022.2022.00050 DO https://doi.org/10.1109/VLSID2022.2022.00050 SF ELIB - SuUB Bremen
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