I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
40nm Ultra-low Leakage SRAM with Embedded Sub-threshold Ana..:
, In:
2022 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems (VLSID)
,
Dhori, Kedar Janardan
;
Kumar, Promod
;
Lecocq, Christophe
... - p. 216-221 , 2022
Link:
https://doi.org/10.1109/VLSID2022.2022.00050
RT T1
2022 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems (VLSID)
: T1
40nm Ultra-low Leakage SRAM with Embedded Sub-threshold Analog Closed Loop System for Efficient Source Biasing of the Memory Array in Retention Mode
UL https://suche.suub.uni-bremen.de/peid=ieee-9885904&Exemplar=1&LAN=DE A1 Dhori, Kedar Janardan A1 Kumar, Promod A1 Lecocq, Christophe A1 Urard, Pascal A1 Callen, Olivier A1 Cacho, Florian A1 Parra, Maryline A1 Pandey, Prashant A1 Noblet, Daniel YR 2022 SN 2380-6923 K1 Temperature sensors K1 Temperature measurement K1 Random access memory K1 Very large scale integration K1 Silicon K1 Regulation K1 Temperature control K1 SRAM K1 Low Leakage K1 IoT K1 Low Vmin K1 source bias K1 RNM SP 216 OP 221 LK http://dx.doi.org/https://doi.org/10.1109/VLSID2022.2022.00050 DO https://doi.org/10.1109/VLSID2022.2022.00050 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)