I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Static Malware Analysis using ELF features for Linux based ..:
, In:
2022 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems (VLSID)
,
Ravi, Akshara
;
Chaturvedi, Vivek
- p. 114-119 , 2022
Link:
https://doi.org/10.1109/VLSID2022.2022.00033
RT T1 <cTitle>2022 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems (VLSID)</cTitle>: T1 <Title>Static Malware Analysis using ELF features for Linux based IoT devices</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9885917&Exemplar=1&LAN=DE A1 Ravi, Akshara A1 Chaturvedi, Vivek YR 2022 SN 2380-6923 K1 Ground penetrating radar K1 Embedded systems K1 Linux K1 Geophysical measurement techniques K1 Very large scale integration K1 Feature extraction K1 Malware K1 ELF K1 chi-square K1 feature selection K1 malware K1 IoT K1 resource-constrained K1 accuracy K1 machine-learning SP 114 OP 119 LK http://dx.doi.org/https://doi.org/10.1109/VLSID2022.2022.00033 DO https://doi.org/10.1109/VLSID2022.2022.00033 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
