I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Investigation of Induced EFT Transient Noise and Effect on ..:
, In:
2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)
,
Lin, Han-Nien
;
Ho, Tzu-Hao
;
Syu, Wan-Yu
... - p. 1-3 , 2022
Link:
https://doi.org/10.1109/APEMC53576.2022.9888343
RT T1 <cTitle>2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)</cTitle>: T1 <Title>Investigation of Induced EFT Transient Noise and Effect on Chip and Package Level</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9888343&Exemplar=1&LAN=DE A1 Lin, Han-Nien A1 Ho, Tzu-Hao A1 Syu, Wan-Yu A1 Wei, Yu-Ming A1 Lee, Yueh-Hsun A1 Ye, Qain-Yu A1 Huang, Cheng-Hao A1 Ku, Yuan-Fu A1 Lin, Liang-Yang A1 Lin, JeffreyYen-Ting YR 2022 SN 2640-7469 K1 Analytical models K1 Capacitors K1 Immunity testing K1 Generators K1 Finite element analysis K1 Transient analysis K1 Integrated circuit modeling K1 EFT Burst Transient Noise K1 Immunity K1 EMS SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/APEMC53576.2022.9888343 DO https://doi.org/10.1109/APEMC53576.2022.9888343 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
