I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Electromagnetic Interference Attacks on GaN Half- Bridge Mo..:
, In:
2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)
,
Fan, Fei
;
Zhao, Zhenyu
;
Tu, Pengfei
... - p. 225-227 , 2022
Link:
https://doi.org/10.1109/APEMC53576.2022.9888557
RT T1 <cTitle>2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)</cTitle>: T1 <Title>Electromagnetic Interference Attacks on GaN Half- Bridge Module</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9888557&Exemplar=1&LAN=DE A1 Fan, Fei A1 Zhao, Zhenyu A1 Tu, Pengfei A1 Jie, Huamin A1 Dong, Minghai A1 See, Kye Yak YR 2022 SN 2640-7469 K1 Bridges K1 Electric potential K1 Electromagnetic interference K1 Logic gates K1 Electromagnetic compatibility K1 Frequency measurement K1 Gallium nitride K1 Conducted susceptibility test K1 False triggering K1 Intentional electromagnetic interference (IEMI) K1 Gallium nitride (GaN) devices SP 225 OP 227 LK http://dx.doi.org/https://doi.org/10.1109/APEMC53576.2022.9888557 DO https://doi.org/10.1109/APEMC53576.2022.9888557 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
