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1 Ergebnisse
1
SASIMI: Evaluation Board for EM Information Leakage from La..:
, In:
2022 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)
,
Fujimoto, Daisuke
;
Kim, Youngwoo
;
Hayashi, Yuichi
... - p. 299-302 , 2022
Link:
https://doi.org/10.1109/EMCSI39492.2022.9889445
RT T1 <cTitle>2022 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)</cTitle>: T1 <Title>SASIMI: Evaluation Board for EM Information Leakage from Large Scale Cryptographic Circuits</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9889445&Exemplar=1&LAN=DE A1 Fujimoto, Daisuke A1 Kim, Youngwoo A1 Hayashi, Yuichi A1 Homma, Naofumi A1 Hashimoto, Masanori A1 Sato, Takashi A1 Danger, Jean-Luc YR 2022 K1 Resistance K1 Power measurement K1 Power supplies K1 Working environment noise K1 Prototypes K1 Cryptography K1 Noise measurement K1 Common platform K1 Information leakage K1 Measurement K1 Side-channel leakage SP 299 OP 302 LK http://dx.doi.org/https://doi.org/10.1109/EMCSI39492.2022.9889445 DO https://doi.org/10.1109/EMCSI39492.2022.9889445 SF ELIB - SuUB Bremen
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