I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Dielectric Loss Tangent Extraction Using Two Single-ended S..:
, In:
2022 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)
,
Li, Jiangshuai
;
Liu, Yuanzhuo
;
Liu, Liang
... - p. 86-91 , 2022
Link:
https://doi.org/10.1109/EMCSI39492.2022.9889568
RT T1 <cTitle>2022 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)</cTitle>: T1 <Title>Dielectric Loss Tangent Extraction Using Two Single-ended Striplines of Different Width</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9889568&Exemplar=1&LAN=DE A1 Li, Jiangshuai A1 Liu, Yuanzhuo A1 Liu, Liang A1 Xia, Shengxuan A1 Hinaga, Scott A1 Khilkevich, Victor YR 2022 K1 Strips K1 Stripline K1 Dielectric materials K1 Dielectric losses K1 Dielectric loss measurement K1 Loss measurement K1 Surface roughness K1 Loss tangent K1 surface roughness K1 cross-sectional analysis K1 S-parameters K1 de-embedding K1 error analysis K1 SPDR SP 86 OP 91 LK http://dx.doi.org/https://doi.org/10.1109/EMCSI39492.2022.9889568 DO https://doi.org/10.1109/EMCSI39492.2022.9889568 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
