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1 Ergebnisse
1
A Low EMI characteristic of LPDDR5 SDRAM with Edge-placed P..:
, In:
2022 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)
,
Kim, Jun-Bae
;
Kwon, Chang Ki
;
Park, Sangwook
... - p. 64-68 , 2022
Link:
https://doi.org/10.1109/EMCSI39492.2022.9889642
RT T1 <cTitle>2022 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)</cTitle>: T1 <Title>A Low EMI characteristic of LPDDR5 SDRAM with Edge-placed PADs and Short Re-Distribution Lines</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9889642&Exemplar=1&LAN=DE A1 Kim, Jun-Bae A1 Kwon, Chang Ki A1 Park, Sangwook A1 Sung, Yoo-Chang A1 Ihm, Jeong Don A1 Kim, Wooil A1 Jin, Jungho A1 Hwang, Sangjoon A1 Yoo, Changsik A1 Choi, Jung-Hwan A1 Kim, Jingook YR 2022 K1 Semiconductor device measurement K1 Power measurement K1 Simulation K1 Current measurement K1 Electromagnetic interference K1 Resonant frequency K1 Market research K1 EMI K1 Rdl K1 Power Planes K1 Resonance K1 RFI K1 LPDDR5 SP 64 OP 68 LK http://dx.doi.org/https://doi.org/10.1109/EMCSI39492.2022.9889642 DO https://doi.org/10.1109/EMCSI39492.2022.9889642 SF ELIB - SuUB Bremen
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