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Evaluation of Copper and Gold Wire Bonds in PEM Devices:
, In:
2022 Annual Reliability and Maintainability Symposium (RAMS)
,
Myer, Brian
;
Gallardo, Eric
;
Melosky, Steve
. - p. 1-6 , 2022
Link:
https://doi.org/10.1109/RAMS51457.2022.9893945
RT T1 <cTitle>2022 Annual Reliability and Maintainability Symposium (RAMS)</cTitle>: T1 <Title>Evaluation of Copper and Gold Wire Bonds in PEM Devices</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9893945&Exemplar=1&LAN=DE A1 Myer, Brian A1 Gallardo, Eric A1 Melosky, Steve A1 Aldridge, Dustin YR 2022 SN 2577-0993 K1 Gold K1 Manufacturing processes K1 Wires K1 Random access memory K1 Robustness K1 Reliability K1 Copper K1 gold K1 wire bond K1 PEM reliabiltiy K1 decapsulation K1 environmental stress K1 wire pull SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/RAMS51457.2022.9893945 DO https://doi.org/10.1109/RAMS51457.2022.9893945 SF ELIB - SuUB Bremen
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