I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Nanoscale CMOS Modeling based on Artificial Neural Networks..:
, In:
2022 37th International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC)
,
Song, Yeon-Seob
;
Pu, Young-Gun
;
Lee, Kang-Yoon
- p. 605-609 , 2022
Link:
https://doi.org/10.1109/ITC-CSCC55581.2022.9894944
RT T1
2022 37th International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC)
: T1
Nanoscale CMOS Modeling based on Artificial Neural Networks: Design of SRAM Circuit for Reliability
UL https://suche.suub.uni-bremen.de/peid=ieee-9894944&Exemplar=1&LAN=DE A1 Song, Yeon-Seob A1 Pu, Young-Gun A1 Lee, Kang-Yoon YR 2022 K1 Semiconductor device modeling K1 Computer network reliability K1 Computational modeling K1 Random access memory K1 Artificial neural networks K1 Predictive models K1 Nanoscale devices K1 ANN K1 MLP K1 CMOS modeling K1 SRAM K1 SNM K1 Verilog-A K1 High Reliability SP 605 OP 609 LK http://dx.doi.org/https://doi.org/10.1109/ITC-CSCC55581.2022.9894944 DO https://doi.org/10.1109/ITC-CSCC55581.2022.9894944 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)