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1 Ergebnisse
1
Single-Sweep vs. Banded Characterizations of a D-band Ultra..:
, In:
2022 99th ARFTG Microwave Measurement Conference (ARFTG)
,
Li, Lei
;
Reyes, Steve
;
Asadi, Mohammad Javad
... - p. 1-4 , 2022
Link:
https://doi.org/10.1109/ARFTG54656.2022.9896408
RT T1 <cTitle>2022 99th ARFTG Microwave Measurement Conference (ARFTG)</cTitle>: T1 <Title>Single-Sweep vs. Banded Characterizations of a D-band Ultra-Low-Loss SiC Substrate-Integrated Waveguide</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9896408&Exemplar=1&LAN=DE A1 Li, Lei A1 Reyes, Steve A1 Asadi, Mohammad Javad A1 Jena, Debdeep A1 Xing, Huili Grace A1 Fay, Patrick A1 Hwang, James C. M. YR 2022 K1 Microwave measurement K1 Waveguide transitions K1 Silicon carbide K1 Millimeter wave measurements K1 Network analyzers K1 Insertion loss K1 Calibration K1 microwave measurement K1 millimeter wave K1 on-wafer measurement K1 vector network analyzer SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ARFTG54656.2022.9896408 DO https://doi.org/10.1109/ARFTG54656.2022.9896408 SF ELIB - SuUB Bremen
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