I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Demonstration of non-invasive probing of CMOS devices with ..:
, In:
2022 99th ARFTG Microwave Measurement Conference (ARFTG)
,
Sakamaki, R.
;
Kishikawa, R.
;
Tojima, Y.
... - p. 1-4 , 2022
Link:
https://doi.org/10.1109/ARFTG54656.2022.9896502
RT T1 <cTitle>2022 99th ARFTG Microwave Measurement Conference (ARFTG)</cTitle>: T1 <Title>Demonstration of non-invasive probing of CMOS devices with aluminum pads at frequencies up to 500 GHz</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9896502&Exemplar=1&LAN=DE A1 Sakamaki, R. A1 Kishikawa, R. A1 Tojima, Y. A1 Kon, S. A1 Somada, I. A1 Matsui, S. A1 Taoka, G. A1 Yoshida, T. A1 Amakawa, S. A1 Fujishima, M. YR 2022 K1 Microwave measurement K1 Semiconductor device measurement K1 Aluminum K1 Transmission line measurements K1 CMOS technology K1 Frequency measurement K1 Scattering parameters K1 On-wafer measurement K1 CMOS K1 contact resistance K1 measurement technique K1 millimeter-wave K1 terahertz SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ARFTG54656.2022.9896502 DO https://doi.org/10.1109/ARFTG54656.2022.9896502 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
