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Software Product Reliability Based on Basic Block Metrics R..:

, In: 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS),
Fiorucci, Tiziano ; Natale, Giorgio Di ; Daveau, Jean-Marc. - p. 1-5 , 2022
Link: https://doi.org/10.1109/IOLTS56730.2022.9897289