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1 Ergebnisse
1
Multi-Step Test-Time Adaptation with Entropy Minimization a..:
, In:
2022 IEEE International Conference on Image Processing (ICIP)
,
Kingetsu, Hiroaki
;
Kobayashi, Kenichi
;
Okawa, Yoshihiro
.. - p. 4153-4157 , 2022
Link:
https://doi.org/10.1109/ICIP46576.2022.9897419
RT T1 <cTitle>2022 IEEE International Conference on Image Processing (ICIP)</cTitle>: T1 <Title>Multi-Step Test-Time Adaptation with Entropy Minimization and Pseudo-Labeling</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9897419&Exemplar=1&LAN=DE A1 Kingetsu, Hiroaki A1 Kobayashi, Kenichi A1 Okawa, Yoshihiro A1 Yokota, Yasuto A1 Nakazawa, Katsuhito YR 2022 SN 2381-8549 K1 Training K1 Adaptation models K1 Image processing K1 Neural networks K1 Training data K1 Semisupervised learning K1 Predictive models K1 Test-Time Adaptation K1 Image Corruption K1 Perturbation K1 Robustness SP 4153 OP 4157 LK http://dx.doi.org/https://doi.org/10.1109/ICIP46576.2022.9897419 DO https://doi.org/10.1109/ICIP46576.2022.9897419 SF ELIB - SuUB Bremen
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