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1 Ergebnisse
1
A Data-Driven Approach for Automated Integrated Circuit Seg..:
, In:
2022 IEEE International Conference on Image Processing (ICIP)
,
Yu, Zifan
;
Trindade, Bruno Machado
;
Green, Michael
... - p. 2851-2855 , 2022
Link:
https://doi.org/10.1109/ICIP46576.2022.9897544
RT T1 <cTitle>2022 IEEE International Conference on Image Processing (ICIP)</cTitle>: T1 <Title>A Data-Driven Approach for Automated Integrated Circuit Segmentation of Scan Electron Microscopy Images</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9897544&Exemplar=1&LAN=DE A1 Yu, Zifan A1 Trindade, Bruno Machado A1 Green, Michael A1 Zhang, Zhikang A1 Sneha, Pullela A1 Tavakoli, Erfan Bank A1 Pawlowicz, Christopher A1 Ren, Fengbo YR 2022 SN 2381-8549 K1 Integrated circuits K1 Image segmentation K1 Scanning electron microscopy K1 Wires K1 Industry applications K1 Electrostatic discharges K1 Task analysis K1 image segmentation K1 deep learning K1 scan electron microscopy images K1 integrated circuit segmentation SP 2851 OP 2855 LK http://dx.doi.org/https://doi.org/10.1109/ICIP46576.2022.9897544 DO https://doi.org/10.1109/ICIP46576.2022.9897544 SF ELIB - SuUB Bremen
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