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1 Ergebnisse
1
Exploring Active Learning for Semiconductor Defect Segmenta..:
, In:
2022 IEEE International Conference on Image Processing (ICIP)
,
Cai, Lile
;
Pahwa, Ramanpreet Singh
;
Xu, Xun
... - p. 1796-1800 , 2022
Link:
https://doi.org/10.1109/ICIP46576.2022.9897842
RT T1 <cTitle>2022 IEEE International Conference on Image Processing (ICIP)</cTitle>: T1 <Title>Exploring Active Learning for Semiconductor Defect Segmentation</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9897842&Exemplar=1&LAN=DE A1 Cai, Lile A1 Pahwa, Ramanpreet Singh A1 Xu, Xun A1 Wang, Jie A1 Chang, Richard A1 Zhang, Lining A1 Foo, Chuan-Sheng YR 2022 SN 2381-8549 K1 Deep learning K1 Visualization K1 Microscopy K1 Bandwidth K1 Semiconductor device manufacture K1 Inspection K1 Benchmark testing K1 Active Learning K1 Semantic Segmentation K1 Semiconductor Structures SP 1796 OP 1800 LK http://dx.doi.org/https://doi.org/10.1109/ICIP46576.2022.9897842 DO https://doi.org/10.1109/ICIP46576.2022.9897842 SF ELIB - SuUB Bremen
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