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1 Ergebnisse
1
Linear Discriminant Analysis Metric Learning Using Siamese ..:
, In:
2022 IEEE International Conference on Image Processing (ICIP)
,
Jose, Abin
;
Mei, Qi
;
Eschweiler, Dennis
.. - p. 3641-3645 , 2022
Link:
https://doi.org/10.1109/ICIP46576.2022.9897925
RT T1
2022 IEEE International Conference on Image Processing (ICIP)
: T1
Linear Discriminant Analysis Metric Learning Using Siamese Neural Networks
UL https://suche.suub.uni-bremen.de/peid=ieee-9897925&Exemplar=1&LAN=DE A1 Jose, Abin A1 Mei, Qi A1 Eschweiler, Dennis A1 Laube, Ina A1 Stegmaier, Johannes YR 2022 SN 2381-8549 K1 Measurement K1 Visualization K1 Image processing K1 Neural networks K1 Linear discriminant analysis K1 KL divergence K1 Dimensionality reduction K1 Metric learning SP 3641 OP 3645 LK http://dx.doi.org/https://doi.org/10.1109/ICIP46576.2022.9897925 DO https://doi.org/10.1109/ICIP46576.2022.9897925 SF ELIB - SuUB Bremen
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