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1 Ergebnisse
1
Automatic Defect Segmentation by Unsupervised Anomaly Learn..:
, In:
2022 IEEE International Conference on Image Processing (ICIP)
,
Ofir, Nati
;
Yacobi, Ran
;
Granoviter, Omer
.. - p. 306-310 , 2022
Link:
https://doi.org/10.1109/ICIP46576.2022.9898035
RT T1 <cTitle>2022 IEEE International Conference on Image Processing (ICIP)</cTitle>: T1 <Title>Automatic Defect Segmentation by Unsupervised Anomaly Learning</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9898035&Exemplar=1&LAN=DE A1 Ofir, Nati A1 Yacobi, Ran A1 Granoviter, Omer A1 Levant, Boris A1 Shtalrid, Ore YR 2022 SN 2381-8549 K1 Training K1 Image segmentation K1 Head K1 Shape K1 Manuals K1 Implants K1 Semiconductor device manufacture K1 Defect Segmentation K1 Data Augmentation K1 Contrastive Learning SP 306 OP 310 LK http://dx.doi.org/https://doi.org/10.1109/ICIP46576.2022.9898035 DO https://doi.org/10.1109/ICIP46576.2022.9898035 SF ELIB - SuUB Bremen
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