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On-Chip Nano Pulse Test Element Group for Analysis of Synap..:

, In: 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS),
Ryu, Tae-Gyu ; Kim, Seong-Hyun ; Song, Ki-Woo... - p. 1-3 , 2022
Link: https://doi.org/10.1109/ICMTS50340.2022.9898163