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1 Ergebnisse
1
Introduction of a Reset MOSFET to Mitigate the Influence of..:
, In:
2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS)
,
Liu, Jinbo
;
Haroldson, Ross
;
Verkhogliadov, Grigorii
... - p. 1-4 , 2022
Link:
https://doi.org/10.1109/ICMTS50340.2022.9898238
RT T1
2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS)
: T1
Introduction of a Reset MOSFET to Mitigate the Influence of Ionic Movement in Perovskite MOSFET Photodetector Measurements
UL https://suche.suub.uni-bremen.de/peid=ieee-9898238&Exemplar=1&LAN=DE A1 Liu, Jinbo A1 Haroldson, Ross A1 Verkhogliadov, Grigorii A1 Lin, Dayang A1 Gu, Qing A1 Zakhidov, Anvar A A1 Hu, Wenchuang A1 Young, Chadwin D YR 2022 SN 2158-1029 K1 MOSFET K1 Dark current K1 Photodetectors K1 Perovskites K1 Microelectronics K1 Hysteresis K1 perovskites K1 photodetector K1 ultrasensitive K1 ionic movement SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ICMTS50340.2022.9898238 DO https://doi.org/10.1109/ICMTS50340.2022.9898238 SF ELIB - SuUB Bremen
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