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1 Ergebnisse
1
Combined Machine Learning Techniques For Characteristics Cl..:
, In:
2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS)
,
Kocak, Husnu Murat
;
Mitard, Jerome
;
Naskali, Ahmet Teoman
- p. 1-9 , 2022
Link:
https://doi.org/10.1109/ICMTS50340.2022.9898251
RT T1
2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS)
: T1
Combined Machine Learning Techniques For Characteristics Classification and Threshold Voltage Extraction of Transistors
UL https://suche.suub.uni-bremen.de/peid=ieee-9898251&Exemplar=1&LAN=DE A1 Kocak, Husnu Murat A1 Mitard, Jerome A1 Naskali, Ahmet Teoman YR 2022 SN 2158-1029 K1 Semiconductor device modeling K1 Semiconductor device measurement K1 Voltage measurement K1 Machine learning K1 FinFETs K1 Threshold voltage K1 Microelectronics K1 Semiconductors K1 Transistor defect K1 Machine Learning K1 Convolutional Neural Network K1 Threshold Voltage Extraction SP 1 OP 9 LK http://dx.doi.org/https://doi.org/10.1109/ICMTS50340.2022.9898251 DO https://doi.org/10.1109/ICMTS50340.2022.9898251 SF ELIB - SuUB Bremen
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