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1 Ergebnisse
1
Correlation between Near-Field Scan Immunity and Radiated S..:
, In:
2022 International Symposium on Electromagnetic Compatibility – EMC Europe
,
Boyer, A.
;
Nolhier, N.
;
Caignet, F.
. - p. 120-125 , 2022
Link:
https://doi.org/10.1109/EMCEurope51680.2022.9900970
RT T1 <cTitle>2022 International Symposium on Electromagnetic Compatibility – EMC Europe</cTitle>: T1 <Title>Correlation between Near-Field Scan Immunity and Radiated Susceptibility at Integrated Circuit Level</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9900970&Exemplar=1&LAN=DE A1 Boyer, A. A1 Nolhier, N. A1 Caignet, F. A1 Dhia, S. Ben YR 2022 SN 2325-0364 K1 Couplings K1 Photonic band gap K1 Integrated circuit interconnections K1 Estimation K1 Prediction methods K1 Immunity testing K1 Calibration K1 Near-field scan K1 radiated susceptibility K1 TEM/GTM cell K1 integrated circuit K1 near-field probe calibration SP 120 OP 125 LK http://dx.doi.org/https://doi.org/10.1109/EMCEurope51680.2022.9900970 DO https://doi.org/10.1109/EMCEurope51680.2022.9900970 SF ELIB - SuUB Bremen
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