I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Including Experimental Aging of Shielded Cables into Bulk C..:
, In:
2022 International Symposium on Electromagnetic Compatibility – EMC Europe
,
Leppaaho, Oskari
;
Lafon, Frederic
;
Ferreri, Bruno
... - p. 811-815 , 2022
Link:
https://doi.org/10.1109/EMCEurope51680.2022.9901089
RT T1 <cTitle>2022 International Symposium on Electromagnetic Compatibility – EMC Europe</cTitle>: T1 <Title>Including Experimental Aging of Shielded Cables into Bulk Current Injection Simulations</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9901089&Exemplar=1&LAN=DE A1 Leppaaho, Oskari A1 Lafon, Frederic A1 Ferreri, Bruno A1 Fernandez-Lopez, Priscila A1 Stojanovic, Marine A1 Perdriau, Richard A1 Ramdani, Mohammed YR 2022 SN 2325-0364 K1 Resistance K1 Radio frequency K1 Coaxial cables K1 Accelerated aging K1 System performance K1 Mechanical cables K1 Impedance K1 Electromagnetic compatibility K1 cable shielding K1 transfer impedance K1 aging K1 reliability K1 bulk current injection K1 simulation SP 811 OP 815 LK http://dx.doi.org/https://doi.org/10.1109/EMCEurope51680.2022.9901089 DO https://doi.org/10.1109/EMCEurope51680.2022.9901089 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)
