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1 Ergebnisse
1
Foreground Static Error Calibration for Current Sources Usi..:
, In:
2022 IEEE 7th Forum on Research and Technologies for Society and Industry Innovation (RTSI)
,
Beauquier, Clement
;
Duperray, David
;
Jabbour, Chadi
... - p. 19-24 , 2022
Link:
https://doi.org/10.1109/RTSI55261.2022.9905200
RT T1 <cTitle>2022 IEEE 7th Forum on Research and Technologies for Society and Industry Innovation (RTSI)</cTitle>: T1 <Title>Foreground Static Error Calibration for Current Sources Using Backgate Body Biasing</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9905200&Exemplar=1&LAN=DE A1 Beauquier, Clement A1 Duperray, David A1 Jabbour, Chadi A1 Desgreys, Patricia A1 Frappe, Antoine A1 Kaiser, Andreas YR 2022 SN 2687-6817 K1 Fabrication K1 Semiconductor device modeling K1 Time-frequency analysis K1 Technological innovation K1 Silicon-on-insulator K1 Calibration K1 Transistors K1 CMOS K1 28 nm FDSOI K1 Current Source K1 Current Steering K1 Foreground Calibration K1 Body Biasing K1 Digital to Analog Converter K1 Amplitude Calibration SP 19 OP 24 LK http://dx.doi.org/https://doi.org/10.1109/RTSI55261.2022.9905200 DO https://doi.org/10.1109/RTSI55261.2022.9905200 SF ELIB - SuUB Bremen
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