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1 Ergebnisse
1
Time-dependent Multiple Gate Voltage Reliability of Hybrid ..:
, In:
2022 IEEE Latin American Electron Devices Conference (LAEDC)
,
Rathaur, Shivendra K.
;
Yang, Tsung-Ying
;
Yang, Chih-Yi
... - p. 1-4 , 2022
Link:
https://doi.org/10.1109/LAEDC54796.2022.9907769
RT T1
2022 IEEE Latin American Electron Devices Conference (LAEDC)
: T1
Time-dependent Multiple Gate Voltage Reliability of Hybrid Ferroelectric Charge Trap Gate Stack (FEG) GaN HEMT for Power Device Applications
UL https://suche.suub.uni-bremen.de/peid=ieee-9907769&Exemplar=1&LAN=DE A1 Rathaur, Shivendra K. A1 Yang, Tsung-Ying A1 Yang, Chih-Yi A1 Chang, Edward Yi A1 Hsu, Heng-Tung A1 Dixit, Abhisek YR 2022 K1 Electron traps K1 Fitting K1 Logic gates K1 HEMTs K1 Hybrid power systems K1 Wide band gap semiconductors K1 Weibull distribution K1 TDDB K1 AlGaN/GaN K1 MIS-HEMT K1 Ferroelectric HEMT K1 E-mode K1 Normally OFF K1 charge trap gate stack K1 Weibull SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/LAEDC54796.2022.9907769 DO https://doi.org/10.1109/LAEDC54796.2022.9907769 SF ELIB - SuUB Bremen
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